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Si8410/20/21
Table 7. Insulation and Safety-Related Specifications
Parameter
Nominal Air Gap (Clearance) 1
Symbol
L(IO1)
Test Condition
Value
4.9
Unit
mm
Nominal External Tracking
(Creepage) 1
L(IO2)
4.01
mm
Minimum Internal Gap (Internal Clearance)
0.008
mm
Tracking Resistance
(Proof Tracking Index)
Erosion Depth
Resistance (Input-Output) 2
PTI
ED
R IO
IEC60112
600
0.040
10 12
V RMS
mm
?
Capacitance
(Input-Output) 2
C IO
f = 1 MHz
1.0
pF
Input Capacitance 3
C I
4.0
pF
Notes:
1. The values in this table correspond to the nominal creepage and clearance values as detailed in "6. Package Outline:
8-Pin Narrow Body SOIC" on page 26. VDE certifies the clearance and creepage limits as 4.7 mm minimum for the NB
SOIC-8 package. UL does not impose a clearance and creepage minimum for component level certifications. CSA
certifies the clearance and creepage limits as 3.9 mm minimum for the NB SOIC-8 package.
2. To determine resistance and capacitance, the Si84xx is converted into a 2-terminal device. Pins 1–4 are shorted
together to form the first terminal and pins 5–8 are shorted together to form the second terminal. The parameters are
then measured between these two terminals.
3. Measured from input pin to ground.
Table 8. IEC 60664-1 (VDE 0844 Part 2) Ratings
Parameter
Basic Isolation Group
Installation Classification
14
Test Condition
Material Group
Rated Mains Voltages < 150 V RMS
Rated Mains Voltages < 300 V RMS
Rated Mains Voltages < 400 V RMS
Rated Mains Voltages < 600 V RMS
Rev. 1.5
Specification
I
I-IV
I-III
I-II
I-II
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